YAMAICHI PLCC32/DIP Spring-loaded IC Burn-in Test Socket IC120-0324-309

This spring-loaded IC burn-in test socket is designed for PLCC32 to DIP conversions, providing a reliable and efficient solution for testing integrated circuits. It features a robust construction that ensures secure IC placement and enduring performance during testing processes. With precise engineering, it facilitates seamless integration into testing setups and is ideal for use in both development and production environments. Its user-friendly design supports quick assembly and disassembly, enhancing productivity and accuracy in testing procedures. Part Number: IC120-0324-309 Model: PLCC32 Manufacture country: China Instructions included: No